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NOVA 400 NANOLAB
카테고리
SEM / FIB개요
The FEI Nova NanoLab 400 is a dual beam device that comes with both a Focused Ion Beam (FIB) and a Field Emission Scanning Electron Microscope (SEM). It is designed to provide high-resolution imaging and analysis, and features a motorized stage for improved results. Another model from FEI, the Helios NanoLab 400, has a five-axis stage that can move 100 mm in both the X and Y directions. Its all-axis piezo drive and chamber mounting offer top-of-the-line stage repeatability. Samples as large as 100 mm can be loaded through the load lock for maximum efficiency.
활성 등재물
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서비스
검사, 보험, 감정, 물류
상위 등재물
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