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설명
-2007 Vintage -Sample wafer holders not included환경 설정
-Cold field emission SEM, with detectors for SE, BSE and low angle BSE Including Loadlock and EDS (LN2 cooled). -Low voltage SEM. Possible acceleration voltages 0.1-30 kV. -Cross section inspection: up to 1.5 cm -Top down inspection: Wafers up to 2" -Windows XP PC and software needs to be upgradedOEM 모델 설명
미제공문서
문서 없음
카테고리
SEM / FIB
마지막 검증일: 24일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
121169
웨이퍼 사이즈:
알 수 없음
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
JEOL
JSM-7500FA
카테고리
SEM / FIB
마지막 검증일: 24일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
121169
웨이퍼 사이즈:
알 수 없음
빈티지:
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
-2007 Vintage -Sample wafer holders not included환경 설정
-Cold field emission SEM, with detectors for SE, BSE and low angle BSE Including Loadlock and EDS (LN2 cooled). -Low voltage SEM. Possible acceleration voltages 0.1-30 kV. -Cross section inspection: up to 1.5 cm -Top down inspection: Wafers up to 2" -Windows XP PC and software needs to be upgradedOEM 모델 설명
미제공문서
문서 없음