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ZEISS /LEO 1455
  • ZEISS /LEO 1455
  • ZEISS /LEO 1455
  • ZEISS /LEO 1455
  • ZEISS /LEO 1455
  • ZEISS /LEO 1455
설명
LEO Scanning Electron Microscope (Parts only)
환경 설정
환경 설정 없음
OEM 모델 설명
SEM feature extra-large chambers for the non-destructive examination of large samples
문서

문서 없음

카테고리
SEM / FIB

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

116674


웨이퍼 사이즈:

6"/150mm


빈티지:

알 수 없음


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ZEISS /LEO

1455

verified-listing-icon
검증됨
카테고리
SEM / FIB
마지막 검증일: 60일 이상 전
listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/7d426fb981f042aa984d5eccf96fe540_97126791e15d4eff976862694cced86245005c_mw.jpeg
listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/501a377d84aa4c0abd857115dd3231d6_959496be79d94b2896c4a5791ea58b80_mw.jpeg
listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/29d2502418414c2fb8d6629defcd4059_90b1225f192f4ee9a468137c8b61d3241201a_mw.jpeg
listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/4d4a693d127e41abb08f538df286daeb_a3e0f9b95c914ac48a485c1a3eb8b34a1201a_mw.jpeg
listing-photo-d9e255fa1f5645e59ae96f460dfb95ed-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/7998/d9e255fa1f5645e59ae96f460dfb95ed/d1ba609d4f9d48f987531f94161fe853_47af99fce8cc4b35abb769026dbcefb31201a_mw.jpeg
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

116674


웨이퍼 사이즈:

6"/150mm


빈티지:

알 수 없음


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
LEO Scanning Electron Microscope (Parts only)
환경 설정
환경 설정 없음
OEM 모델 설명
SEM feature extra-large chambers for the non-destructive examination of large samples
문서

문서 없음