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SMI3050SE
카테고리
SEM / FIB개요
SMI3050SE is an FIB-SEM hybrid system equipped with an ion beam optical system and electron beam optical system newly developed in response to the shrink of semiconductor devices, enabling high-precision sample processing and observation in comparison to conventional systems.
활성 등재물
1
서비스
검사, 보험, 감정, 물류
