VEGA
카테고리
SEM / FIB개요
TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software.
활성 등재물
1
서비스
검사, 보험, 감정, 물류
