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HITACHI S-4700 I
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    환경 설정
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    OEM 모델 설명
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
    문서

    문서 없음

    HITACHI

    S-4700 I

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    검증됨

    카테고리

    SEM
    마지막 검증일: 60일 이상 전
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    23974


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2011

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    HITACHI S-4700 I
    HITACHIS-4700 ISEM
    빈티지: 0조건: 중고
    마지막 검증일12일 전

    HITACHI

    S-4700 I

    verified-listing-icon

    검증됨

    카테고리

    SEM
    마지막 검증일: 60일 이상 전
    listing-photo-06eaf9f560c44871beea16edff6e0c05-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3077/06eaf9f560c44871beea16edff6e0c05/6e514d9fcb8c4e16ad878c043e967c4d_10677_f.jpeg
    listing-photo-06eaf9f560c44871beea16edff6e0c05-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3077/06eaf9f560c44871beea16edff6e0c05/77024ed7bcab48b99230dc96318822d2_10678_f.jpeg
    listing-photo-06eaf9f560c44871beea16edff6e0c05-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3077/06eaf9f560c44871beea16edff6e0c05/6ab8ed724ba240658e31e5e8d345a7ca_10675_f.jpeg
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    listing-photo-06eaf9f560c44871beea16edff6e0c05-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3077/06eaf9f560c44871beea16edff6e0c05/5602cc7e62f14f51b53858338798cb8a_10685_f.jpeg
    listing-photo-06eaf9f560c44871beea16edff6e0c05-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3077/06eaf9f560c44871beea16edff6e0c05/72335dca0b9742d9a31506a93a59d86f_10686_f.jpeg
    listing-photo-06eaf9f560c44871beea16edff6e0c05-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3077/06eaf9f560c44871beea16edff6e0c05/70dedff2a40c46c0a6a6e415f7bb4a27_10705_f.jpeg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    23974


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2011


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The S-4700 Type I is a cutting-edge electron microscope with remarkable features. It offers high-resolution imaging at low accelerating voltages, ensuring a guaranteed resolution of 2.1 nm at 1 kV. Routine microscopy is made convenient with a long working distance of 12 mm, allowing sample exchange via an airlock without the need for repositioning. At 15 kV, the microscope maintains a high resolution of 1.5 nm. Additionally, it enables a sample tilt of 45 degrees without altering the working distance and offers a high X-ray take-off angle of 30 degrees with the sample normal to the beam. The instrument boasts an integrated electron detector for both secondary electrons (SE) and backscattered electrons (BSE), allowing operators to choose the best imaging mode for their samples. With complete column setup controlled through a computer interface, users can effortlessly switch between ultra-high-resolution mode and analysis mode. The unique objective lens design permits simultaneous use of YAG-type BSE and EDX detectors, enhancing imaging versatility.
    문서

    문서 없음

    유사 등재물
    모두 보기
    HITACHI S-4700 I
    HITACHI
    S-4700 I
    SEM빈티지: 0조건: 중고마지막 검증일: 12일 전
    HITACHI S-4700 I
    HITACHI
    S-4700 I
    SEM빈티지: 0조건: 중고마지막 검증일: 60일 이상 전
    HITACHI S-4700 I
    HITACHI
    S-4700 I
    SEM빈티지: 1998조건: 중고마지막 검증일: 60일 이상 전