E3630
카테고리
SEM개요
Multi Vision Metrology Scanning Electron Microscope In addition to its high-functionality CD-SEM features, the E3630 makes 3D imaging and measurement at the nanometer level, in real time and in a non-destructive way, possible. The E3630 significantly contributes to reducing TAT in R&D and production for many processes that require high-precision and/or 3D analysis.
활성 등재물
1
서비스
검사, 보험, 감정, 물류