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THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200
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    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.
    문서

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    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

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    검증됨

    카테고리
    SEM

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    110035


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    SEM
    빈티지: 0조건: 중고
    마지막 검증일30일 이상 전

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    verified-listing-icon
    검증됨
    카테고리
    SEM
    마지막 검증일: 60일 이상 전
    listing-photo-d8a3774c25434db3af51ca808c695f59-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    110035


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The FEI FIB 200 is a type of Focused Ion Beam (FIB) system that has many uses, such as editing circuits, analyzing defects and failures, preparing TEM lamella, fabricating nanostructures, prototyping at the nanoscale, and working with MEMS. There are a few different models of the FEI FIB 200, including the FEI FIB 200-M and the FEI FIB 200-P. The FEI FIB 200-M model features a Magnum ion column that provides twice the milling power of earlier pre-lens FIB columns. It also has a voltage range of 5-30kV for its Magnum column, a beam current of 21nA for milling power, and CDEM for ion and electron imaging with a resolution of 7nm. The FEI FIB 200-P model, on the other hand, uses a pre-lens ion column.
    문서

    문서 없음

    유사 등재물
    모두 보기
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    SEM빈티지: 0조건: 중고마지막 검증일:30일 이상 전
    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS FIB 200

    THERMOFISHER SCIENTIFIC / FEI / PHILLIPS

    FIB 200

    SEM빈티지: 0조건: 중고마지막 검증일:60일 이상 전