메인 콘텐츠로 건너뛰기
Moov logo

Moov Icon
HITACHI S-4700 II
    설명
    Win XP As-Is Operational Condition
    환경 설정
    STEM Detector Not included with base unit. LN2 EDX Included but not attached to tool currently
    OEM 모델 설명
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    문서

    HITACHI

    S-4700 II

    verified-listing-icon

    검증됨

    카테고리

    SEM
    마지막 검증일: 60일 이상 전
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    36387


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    HITACHI S-4700 II
    HITACHIS-4700 IISEM
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    HITACHI

    S-4700 II

    verified-listing-icon

    검증됨

    카테고리

    SEM
    마지막 검증일: 60일 이상 전
    listing-photo-3febc08917b945678cdb92f9be66882a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1454/3febc08917b945678cdb92f9be66882a/87600ed9fb964adcb61fe0f991f6b629_1d3fce4189ba4a429269211d071a5e0f1105c_mw.jpeg
    listing-photo-3febc08917b945678cdb92f9be66882a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1454/3febc08917b945678cdb92f9be66882a/5515c3fa77a8407b9500781dd1d01b73_fe2afabb71b84a23815e7d2cca3d3dba1105c_mw.jpeg
    listing-photo-3febc08917b945678cdb92f9be66882a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1454/3febc08917b945678cdb92f9be66882a/8446cf725ba54528a81c6e5167bd7abf_6088db6ed30d48eaad85590eb141fab11105c_mw.jpeg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    36387


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Win XP As-Is Operational Condition
    환경 설정
    STEM Detector Not included with base unit. LN2 EDX Included but not attached to tool currently
    OEM 모델 설명
    HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.
    문서
    유사 등재물
    모두 보기
    HITACHI S-4700 II
    HITACHI
    S-4700 II
    SEM빈티지: 0조건: 중고마지막 검증일: 60일 이상 전
    HITACHI S-4700 II
    HITACHI
    S-4700 II
    SEM빈티지: 0조건: 중고마지막 검증일: 60일 이상 전
    HITACHI S-4700 II
    HITACHI
    S-4700 II
    SEM빈티지: 0조건: 개조됨마지막 검증일: 60일 이상 전