설명
설명 없음환경 설정
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEM 모델 설명
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.문서
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HITACHI
S-4700 II
검증됨
카테고리
SEM
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
23124
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-4700 II
검증됨
카테고리
SEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
23124
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
Hitachi S-4700-II is a Cold Field Emission Gun Scanning Electron Microscope (CFE-SEM), it combines the versatility of PC control with a novel electron optical column to give an exceptional performance on large and small specimens. The S-4700-II also offers excellent low kV performance with a guaranteed resolution of 2.1 nm at 1 kV at a working distance of 1.5mm. Available image mode includes a secondary electron image. There are two secondary electron detectors; one above the objective lens, the other below. The Oxford EDS system is included. This S-4700 II is fully refurbished and operational at our Tustin, CA facility.OEM 모델 설명
HITACHI S 4700 II is a SEM & TEM system. The S 4700 II has standard secondary electron detector (SE), a backscatter electron detector (BSD) and a Gatan MonoCL cathodoluminescence detector (CL). The BSD is sensitive to slight energy variations occurring when a high energy electron scatters off the nucleus of an atom. This sensitivity allows the BSD to map out variations in the densities of the sample. The CL measures photons released by the sample as it interacts with the electron beam and uses the information gathered from these photons to conduct elemental analysis.문서
문서 없음