AFS-3220 FA
개요
Wafer flatness measurements to 90nm line widths, 200mm/300mm, SOI and bare wafer capability. Measures thickness of wafers by electrical capacitance.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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Wafer flatness measurements to 90nm line widths, 200mm/300mm, SOI and bare wafer capability. Measures thickness of wafers by electrical capacitance.
0
검사, 보험, 감정, 물류