ULTRASCAN 9600
개요
UltraScan Wafer Metrology System The 9600 and 9650 systems, introduced in 1994 and based on the more advanced E-Plus station, measure thickness down to an accuracy of 0.25 microns.
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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Messages
Messages
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