MPT1000
개요
Noncontact system, providing wafer thickness measurements. Specially designed for final backgrind wafers, it can be used as a production tool for in-line quality inspection
활성 등재물
0
서비스
검사, 보험, 감정, 물류
상위 등재물
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Noncontact system, providing wafer thickness measurements. Specially designed for final backgrind wafers, it can be used as a production tool for in-line quality inspection
0
검사, 보험, 감정, 물류