설명
Thickness range: 15nm - 70µm Wavelength range: 380-1050nm Simultaneous measurement of thickness and refractive index환경 설정
-The film thickness measurement. -Working condition. -Vintage 2021 -No missing parts and include calibration wafer.OEM 모델 설명
The F20 Series are general-purpose film thickness measurement instruments used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. The F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range.문서
문서 없음
KLA / FILMETRICS
F20
검증됨
카테고리
Thin Film / Film Thickness
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
65744
웨이퍼 사이즈:
알 수 없음
빈티지:
2021
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA / FILMETRICS
F20
카테고리
Thin Film / Film Thickness
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
65744
웨이퍼 사이즈:
알 수 없음
빈티지:
2021
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Thickness range: 15nm - 70µm Wavelength range: 380-1050nm Simultaneous measurement of thickness and refractive index환경 설정
-The film thickness measurement. -Working condition. -Vintage 2021 -No missing parts and include calibration wafer.OEM 모델 설명
The F20 Series are general-purpose film thickness measurement instruments used in thousands of applications worldwide. Thickness and refractive index can be measured in less than a second. The F20 connects to the USB port of your Windows® computer and sets up in minutes. The different F20 instruments are distinguished primarily by the thickness measurement range, which in turn is determined by the instrument’s wavelength range.문서
문서 없음