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ASML TWINSCAN XT:1700Fi
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    OEM 모델 설명
    The TWINSCAN XT:1700Fi is a state-of-the-art, dual-stage immersion lithography tool, specifically engineered for high-volume 300-mm wafer production. It boasts a resolution of 50 nm and below, making it a powerhouse for intricate semiconductor manufacturing. It features a 1.2-NA in-line catadioptric lens, an illuminator with optimized polarization mode, and advanced stage technology. It meets overlay and focus requirements and achieves a throughput of 122 wafers per hour. The tool also includes an extended ultra-k1 package with various enhancements.
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    ASML

    TWINSCAN XT:1700Fi

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    검증됨

    카테고리
    193 nm Step and Scan

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

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    제품 ID:

    60718


    웨이퍼 사이즈:

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    빈티지:

    알 수 없음

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    Logistics Support
    Available
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    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    ASML TWINSCAN XT:1700Fi

    ASML

    TWINSCAN XT:1700Fi

    193 nm Step and Scan
    빈티지: 2006조건: 중고
    마지막 검증일30일 이상 전

    ASML

    TWINSCAN XT:1700Fi

    verified-listing-icon
    검증됨
    카테고리
    193 nm Step and Scan
    마지막 검증일: 60일 이상 전
    listing-photo-4dbae7db52274e5da5faab5423830361-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    60718


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The TWINSCAN XT:1700Fi is a state-of-the-art, dual-stage immersion lithography tool, specifically engineered for high-volume 300-mm wafer production. It boasts a resolution of 50 nm and below, making it a powerhouse for intricate semiconductor manufacturing. It features a 1.2-NA in-line catadioptric lens, an illuminator with optimized polarization mode, and advanced stage technology. It meets overlay and focus requirements and achieves a throughput of 122 wafers per hour. The tool also includes an extended ultra-k1 package with various enhancements.
    문서

    문서 없음

    유사 등재물
    모두 보기
    ASML TWINSCAN XT:1700Fi

    ASML

    TWINSCAN XT:1700Fi

    193 nm Step and Scan빈티지: 2006조건: 중고마지막 검증일: 30일 이상 전
    ASML TWINSCAN XT:1700Fi

    ASML

    TWINSCAN XT:1700Fi

    193 nm Step and Scan빈티지: 0조건: 중고마지막 검증일: 60일 이상 전