설명
Dimension X3D - Model 340 Atomic Force Microscope (AFM)환경 설정
환경 설정 없음OEM 모델 설명
The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.문서
문서 없음
BRUKER
DIMENSION X3D
검증됨
카테고리
AFM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
89487
웨이퍼 사이즈:
알 수 없음
빈티지:
2005
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
BRUKER
DIMENSION X3D
카테고리
AFM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
89487
웨이퍼 사이즈:
알 수 없음
빈티지:
2005
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Dimension X3D - Model 340 Atomic Force Microscope (AFM)환경 설정
환경 설정 없음OEM 모델 설명
The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.문서
문서 없음