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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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BRUKER DIMENSION X3D
    설명
    설명 없음
    환경 설정
    1 load port (ASYST)
    OEM 모델 설명
    The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.
    문서

    문서 없음

    BRUKER

    DIMENSION X3D

    verified-listing-icon

    검증됨

    카테고리
    AFM

    마지막 검증일: 30일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    63660


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    2004


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    BRUKER DIMENSION X3D

    BRUKER

    DIMENSION X3D

    AFM
    빈티지: 2006조건: 중고
    마지막 검증일60일 이상 전

    BRUKER

    DIMENSION X3D

    verified-listing-icon
    검증됨
    카테고리
    AFM
    마지막 검증일: 30일 이상 전
    listing-photo-cdacd096778c4150b81864931cb90ea6-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    63660


    웨이퍼 사이즈:

    12"/300mm


    빈티지:

    2004


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    1 load port (ASYST)
    OEM 모델 설명
    The Dimension X3D is an Automated Atomic Force Microscope that provides nondestructive, gauge-capable, automated metrology with three-dimensional (X, Y, and Z) in-line characterization of critical dimension (CD) feature shape control. It is designed for critical level control in leading-edge device manufacturing and can gather detailed data on crucial CD elements. The X3D can scan on any material and its AFM technology enables unmatched resolution and repeatability.
    문서

    문서 없음

    유사 등재물
    모두 보기
    BRUKER DIMENSION X3D

    BRUKER

    DIMENSION X3D

    AFM빈티지: 2006조건: 중고마지막 검증일:60일 이상 전
    BRUKER DIMENSION X3D

    BRUKER

    DIMENSION X3D

    AFM빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    BRUKER DIMENSION X3D

    BRUKER

    DIMENSION X3D

    AFM빈티지: 2004조건: 중고마지막 검증일:30일 이상 전