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설명
설명 없음환경 설정
-Configured for 8 inch (6" wafer sizes possible) -SW Version: 11 Options list: SECS Multipoint Measurement Hole Measurement Reduced Scan Image Database CP Controller Save to DOS FD IP Read Operator AccessoriesOEM 모델 설명
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.문서
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유사 등재물
모두 보기
HITACHI
S-7840
카테고리
CD-SEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Refurbished
작동 상태:
알 수 없음
제품 ID:
54796
웨이퍼 사이즈:
8"/200mm
빈티지:
2001
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설명
설명 없음환경 설정
-Configured for 8 inch (6" wafer sizes possible) -SW Version: 11 Options list: SECS Multipoint Measurement Hole Measurement Reduced Scan Image Database CP Controller Save to DOS FD IP Read Operator AccessoriesOEM 모델 설명
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.문서
문서 없음