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SEM환경 설정
환경 설정 없음OEM 모델 설명
The Hitachi S-9200 CD SEM "45 (automatic operation)" is a high-precision scanning electron microscope designed for critical dimension (CD) measurements on semiconductor wafers. It supports 6-inch and 8-inch wafer sizes, making it versatile for various production environments. With its automated operation, it ensures consistent and reliable results while reducing human error. The CD SEM utilizes a focused electron beam to capture high-resolution images, enabling detailed analysis of patterns, line widths, and structural characteristics. Equipped with a 5-point measurement system, it allows for accurate and repeatable measurements across the wafer. The S-9200 CD SEM is an essential tool for semiconductor manufacturers, enabling precise CD measurements and optimization of production processes. Its advanced technology and automation capabilities make it an invaluable asset in quality control and process development.문서
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HITACHI
S-9200
카테고리
CD-SEM
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
105845
웨이퍼 사이즈:
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빈티지:
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설명
SEM환경 설정
환경 설정 없음OEM 모델 설명
The Hitachi S-9200 CD SEM "45 (automatic operation)" is a high-precision scanning electron microscope designed for critical dimension (CD) measurements on semiconductor wafers. It supports 6-inch and 8-inch wafer sizes, making it versatile for various production environments. With its automated operation, it ensures consistent and reliable results while reducing human error. The CD SEM utilizes a focused electron beam to capture high-resolution images, enabling detailed analysis of patterns, line widths, and structural characteristics. Equipped with a 5-point measurement system, it allows for accurate and repeatable measurements across the wafer. The S-9200 CD SEM is an essential tool for semiconductor manufacturers, enabling precise CD measurements and optimization of production processes. Its advanced technology and automation capabilities make it an invaluable asset in quality control and process development.문서
문서 없음