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HITACHI S-9380 II
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    OEM 모델 설명
    Hitachi High-Technologies Corporation has launched DESIGNGAUGE, a mask design data measuring system aimed at improving efficiency and production yield in semiconductor device design and development. DESIGNGAUGE accurately collates and compares mask pattern design data with circuit pattern image data on the wafer, obtained through a critical dimension scanning electron microscope (CD-SEM). It enables the creation of measurement recipes offline that were previously only possible with a CD-SEM, allowing remote control of the CD-SEM to automatically align mask pattern design data with the wafer's test pattern. This significantly streamlines the data acquisition process for creating an optical proximity correction (OPC) model, reducing the time required compared to conventional techniques. Hitachi High-Tech is committed to further enhancing the accuracy and capabilities of DESIGNGAUGE and developing DFM-based measuring technologies to meet evolving metrology needs.
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    검증됨

    카테고리
    CD-SEM

    마지막 검증일: 15일 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    145507


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2007


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    HITACHI S-9380 II

    HITACHI

    S-9380 II

    CD-SEM
    빈티지: 2006조건: 중고
    마지막 검증일어제

    HITACHI

    S-9380 II

    verified-listing-icon
    검증됨
    카테고리
    CD-SEM
    마지막 검증일: 15일 전
    listing-photo-d14923141d884e8991c181df5bec3f03-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89440/d14923141d884e8991c181df5bec3f03/8a3dd29eba304f0385a56946c14a4a32_s42614790_mw.jpg
    listing-photo-d14923141d884e8991c181df5bec3f03-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89440/d14923141d884e8991c181df5bec3f03/73d3b023b0f94b7e904e734ddaadeb12_s42614791_mw.jpg
    listing-photo-d14923141d884e8991c181df5bec3f03-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/89440/d14923141d884e8991c181df5bec3f03/ba5ff577f7bd44838ae75bb09dbaca61_s42614792_mw.jpg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    145507


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2007


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    Hitachi High-Technologies Corporation has launched DESIGNGAUGE, a mask design data measuring system aimed at improving efficiency and production yield in semiconductor device design and development. DESIGNGAUGE accurately collates and compares mask pattern design data with circuit pattern image data on the wafer, obtained through a critical dimension scanning electron microscope (CD-SEM). It enables the creation of measurement recipes offline that were previously only possible with a CD-SEM, allowing remote control of the CD-SEM to automatically align mask pattern design data with the wafer's test pattern. This significantly streamlines the data acquisition process for creating an optical proximity correction (OPC) model, reducing the time required compared to conventional techniques. Hitachi High-Tech is committed to further enhancing the accuracy and capabilities of DESIGNGAUGE and developing DFM-based measuring technologies to meet evolving metrology needs.
    문서

    문서 없음

    유사 등재물
    모두 보기
    HITACHI S-9380 II

    HITACHI

    S-9380 II

    CD-SEM빈티지: 2006조건: 중고마지막 검증일:어제
    HITACHI S-9380 II

    HITACHI

    S-9380 II

    CD-SEM빈티지: 2006조건: 중고마지막 검증일:어제
    HITACHI S-9380 II

    HITACHI

    S-9380 II

    CD-SEM빈티지: 2006조건: 중고마지막 검증일:어제