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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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APPLIED MATERIALS (AMAT) COMPLUS MP
    설명
    Dark field detection No missing parts Current Wafer size : 12
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    문서

    문서 없음

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    검증됨

    카테고리
    Defect Inspection

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Deinstalled


    제품 ID:

    107073


    웨이퍼 사이즈:

    8"/200mm, 12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection
    빈티지: 0조건: 중고
    마지막 검증일7일 전

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-a9188044dee547ceae216cd763a329ca-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Deinstalled


    제품 ID:

    107073


    웨이퍼 사이즈:

    8"/200mm, 12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Dark field detection No missing parts Current Wafer size : 12
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    문서

    문서 없음

    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:7일 전
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:7일 전
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전