설명
-Main System Active damping subsystem (1) -Handler System E-chuck wafer holder & controller (1) -Factory Interface FOUP (2) -Handler System Pre Aligner (1)환경 설정
E84, SECS/GEM, GEM300: CIM Software Version: 5.4.500OEM 모델 설명
The SEMVISION G5 is part of the Applied SEMVision™ family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 2,400 defects per hour. Used in an optimized defect review strategy, these systems can accelerate customers’ production ramp by rapidly identifying the root cause of systematic and yield-limiting defects.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 18일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
150394
웨이퍼 사이즈:
12"/300mm
빈티지:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
SEMVISION G5 HP
카테고리
Defect Inspection
마지막 검증일: 18일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
150394
웨이퍼 사이즈:
12"/300mm
빈티지:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
-Main System Active damping subsystem (1) -Handler System E-chuck wafer holder & controller (1) -Factory Interface FOUP (2) -Handler System Pre Aligner (1)환경 설정
E84, SECS/GEM, GEM300: CIM Software Version: 5.4.500OEM 모델 설명
The SEMVISION G5 is part of the Applied SEMVision™ family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 2,400 defects per hour. Used in an optimized defect review strategy, these systems can accelerate customers’ production ramp by rapidly identifying the root cause of systematic and yield-limiting defects.문서
문서 없음