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APPLIED MATERIALS (AMAT) SEMVISION G5
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    DR-SEM Inspecting
    OEM 모델 설명
    Semvision G5, enables chipmakers to image and analyze 20nm yield-limiting defects in a production environment without manual intervention. Uniquely capable of identifying and imaging relevant defects with 1nm pixel size, the SEMVision G5 system allows logic and memory customers to streamline manufacturing, pinpointing the root cause of defects faster and more accurately than ever before." The breakthrough SEMVision G5 system is an open architecture platform that dynamically combines data received from a wafer inspection system with a library of predefined review strategies. The system automatically creates new review recipes - a major benefit over competing tools that require time-consuming manual recipe creation for every chip type to be inspected. This feature is critical for foundry customers that must rapidly achieve good yield in the thousands of new chip designs they manufacture each year.
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    카테고리
    Defect Inspection

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

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    제품 ID:

    129886


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    빈티지:

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    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    모두 보기
    APPLIED MATERIALS (AMAT) SEMVISION G5

    APPLIED MATERIALS (AMAT)

    SEMVISION G5

    Defect Inspection
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    APPLIED MATERIALS (AMAT)

    SEMVISION G5

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-91f80e68a557497791b9b76f3a4c9552-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    129886


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    DR-SEM Inspecting
    OEM 모델 설명
    Semvision G5, enables chipmakers to image and analyze 20nm yield-limiting defects in a production environment without manual intervention. Uniquely capable of identifying and imaging relevant defects with 1nm pixel size, the SEMVision G5 system allows logic and memory customers to streamline manufacturing, pinpointing the root cause of defects faster and more accurately than ever before." The breakthrough SEMVision G5 system is an open architecture platform that dynamically combines data received from a wafer inspection system with a library of predefined review strategies. The system automatically creates new review recipes - a major benefit over competing tools that require time-consuming manual recipe creation for every chip type to be inspected. This feature is critical for foundry customers that must rapidly achieve good yield in the thousands of new chip designs they manufacture each year.
    문서

    문서 없음

    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) SEMVISION G5

    APPLIED MATERIALS (AMAT)

    SEMVISION G5

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    APPLIED MATERIALS (AMAT) SEMVISION G5

    APPLIED MATERIALS (AMAT)

    SEMVISION G5

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전