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APPLIED MATERIALS (AMAT) COMPLUS 3T
    설명
    Dark field detection No missing parts Current Wafer size : 12
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The AMAT / APPLIED MATERIALS ComPLUS 3T wafer inspection system detects defects in devices with design rules of 65nm and below. The AMAT / APPLIED MATERIALS ComPLUS 3T is used for darkfield applications. The The AMAT / APPLIED MATERIALS ComPLUS 3T wafer and mask inspection system can be used for 12" wafers. Applied ComPlus 3T Inspection is a patterned wafer inspection system that performs high-speed inspection of all Darkfield and BEOL Brightfield applications for 65nm production. Using dual-angle illumination and proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield. Based on the highly successful Compass platform, the ComPlus 3T system transcends the boundaries of traditional darkfield and brightfield inspection, covering the widest optical inspection spectrum with one platform. The ComPlus 3T system solution delivers exceptional advantages in system sensitivity and throughput, as well as significant savings to customers who typically purchase multiple highly specialized inspection tools to cover the same range of applications.
    문서

    문서 없음

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    verified-listing-icon

    검증됨

    카테고리
    Defect Inspection

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Deinstalled


    제품 ID:

    107072


    웨이퍼 사이즈:

    8"/200mm, 12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection
    빈티지: 0조건: 중고
    마지막 검증일60일 이상 전

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-ecadf588a59d462a92a1ca14d4d23405-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Deinstalled


    제품 ID:

    107072


    웨이퍼 사이즈:

    8"/200mm, 12"/300mm


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Dark field detection No missing parts Current Wafer size : 12
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The AMAT / APPLIED MATERIALS ComPLUS 3T wafer inspection system detects defects in devices with design rules of 65nm and below. The AMAT / APPLIED MATERIALS ComPLUS 3T is used for darkfield applications. The The AMAT / APPLIED MATERIALS ComPLUS 3T wafer and mask inspection system can be used for 12" wafers. Applied ComPlus 3T Inspection is a patterned wafer inspection system that performs high-speed inspection of all Darkfield and BEOL Brightfield applications for 65nm production. Using dual-angle illumination and proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield. Based on the highly successful Compass platform, the ComPlus 3T system transcends the boundaries of traditional darkfield and brightfield inspection, covering the widest optical inspection spectrum with one platform. The ComPlus 3T system solution delivers exceptional advantages in system sensitivity and throughput, as well as significant savings to customers who typically purchase multiple highly specialized inspection tools to cover the same range of applications.
    문서

    문서 없음

    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection빈티지: 2005조건: 개조됨마지막 검증일:60일 이상 전
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection빈티지: 2006조건: 중고마지막 검증일:60일 이상 전