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APPLIED MATERIALS (AMAT) SEMVision cX
    설명
    Calibration Tool-NEW
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SEMVision cX is designed for the automatic review and classification of wafer defects in advanced semiconductor production lines. It builds on the company’s SEMVision system and features automatic material identification that characterizes defects on unpatterned wafers and provides chipmakers with information on the defect’s source. The system also offers high-productivity operation at 500 defects per hour and color MPSI (Multiple Perspective SEM Imaging) for enhanced topography and material information. The SEMVision cX is the first SEM review system to feature OperatorFree EDX (energy dispersive x-ray) analysis that increases processing speed of the system and requires less engineering expertise. For the first time, material information is combined with automated defect classification (ADC) to provide fab engineers with all vital defect data.
    문서

    문서 없음

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    verified-listing-icon

    검증됨

    카테고리
    Defect Inspection

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    17059


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) SEMVision cX

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    Defect Inspection
    빈티지: 2000조건: 중고
    마지막 검증일60일 이상 전

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-H4e9D58SfSsXfNj9KMcBPb6oZyDfzNm-81PEdgzzAXM-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/Ot4uSyt7j-OkIRBJeE4orTieeZmN71mOLX5X1zTe7fk/H4e9D58SfSsXfNj9KMcBPb6oZyDfzNm-81PEdgzzAXM/MJCoLCxLatHSz91UbWvVi6EF6Hx43Q6mtkUAfGgyiwk_20190315_091833_f
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    17059


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    Calibration Tool-NEW
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SEMVision cX is designed for the automatic review and classification of wafer defects in advanced semiconductor production lines. It builds on the company’s SEMVision system and features automatic material identification that characterizes defects on unpatterned wafers and provides chipmakers with information on the defect’s source. The system also offers high-productivity operation at 500 defects per hour and color MPSI (Multiple Perspective SEM Imaging) for enhanced topography and material information. The SEMVision cX is the first SEM review system to feature OperatorFree EDX (energy dispersive x-ray) analysis that increases processing speed of the system and requires less engineering expertise. For the first time, material information is combined with automated defect classification (ADC) to provide fab engineers with all vital defect data.
    문서

    문서 없음

    유사 등재물
    모두 보기
    APPLIED MATERIALS (AMAT) SEMVision cX

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    Defect Inspection빈티지: 2000조건: 중고마지막 검증일:60일 이상 전
    APPLIED MATERIALS (AMAT) SEMVision cX

    APPLIED MATERIALS (AMAT)

    SEMVision cX

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전