설명
SEM REVIEW, CU환경 설정
SECS/GEM Capability • Factory Interface: o WIP Delivery: OHT o 25 wafer front opening unified pod (FOUP) carrier (2) • Review Station, SEM Review • 2nm physical resolution • Complete 3D data for superior defect visualization and classification • Analysis of defects as small as 30nm • Facilities Information: o OFA o Process Vacuum o Gases o Process Cooling Water o Ultra pure waterOEM 모델 설명
미제공문서
문서 없음
APPLIED MATERIALS (AMAT)
SEMVISION GX
검증됨
카테고리
Defect Inspection
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
73736
웨이퍼 사이즈:
12"/300mm
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기APPLIED MATERIALS (AMAT)
SEMVISION GX
검증됨
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
73736
웨이퍼 사이즈:
12"/300mm
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
SEM REVIEW, CU환경 설정
SECS/GEM Capability • Factory Interface: o WIP Delivery: OHT o 25 wafer front opening unified pod (FOUP) carrier (2) • Review Station, SEM Review • 2nm physical resolution • Complete 3D data for superior defect visualization and classification • Analysis of defects as small as 30nm • Facilities Information: o OFA o Process Vacuum o Gases o Process Cooling Water o Ultra pure waterOEM 모델 설명
미제공문서
문서 없음