설명
Temporary storage area환경 설정
QC_CuOEM 모델 설명
NanoUDI 9300 standalone wafer particle and defect inspection system. The NanoUDI 9300 stand-alone, high throughput, full-wafer defect inspection system detects and measures particles and defects as small as 0.1 microns on 300 millimeter diameter semiconductor wafers. The system was first introduced at SEMICON West in July 2002 and is built on the common 9300 wafer automation platform that includes the new industry standards for 300 millimeter wafer handling.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 12일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
144864
웨이퍼 사이즈:
12"/300mm
빈티지:
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NanoUDI 9300
카테고리
Defect Inspection
마지막 검증일: 12일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
144864
웨이퍼 사이즈:
12"/300mm
빈티지:
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Temporary storage area환경 설정
QC_CuOEM 모델 설명
NanoUDI 9300 standalone wafer particle and defect inspection system. The NanoUDI 9300 stand-alone, high throughput, full-wafer defect inspection system detects and measures particles and defects as small as 0.1 microns on 300 millimeter diameter semiconductor wafers. The system was first introduced at SEMICON West in July 2002 and is built on the common 9300 wafer automation platform that includes the new industry standards for 300 millimeter wafer handling.문서
문서 없음