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ASML / HMI eScan 1100
  • ASML / HMI eScan 1100
  • ASML / HMI eScan 1100
  • ASML / HMI eScan 1100
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OEM 모델 설명
The first multiple e-beam (multibeam) wafer inspection system for in-line defect inspection applications. Following in the footsteps of the eScan 1000, the eScan 1100 offers new levels of efficiency in high throughput wafer inspection.
문서

문서 없음

ASML / HMI

eScan 1100

verified-listing-icon

검증됨

카테고리
Defect Inspection

마지막 검증일: 60일 이상 전

주요 품목 세부 정보
조건:

Used

작동 상태:

알 수 없음

제품 ID:

72756

웨이퍼 사이즈:

알 수 없음

빈티지:

알 수 없음

Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
ASML / HMI eScan 1100

ASML / HMI

eScan 1100

Defect Inspection
빈티지: 0조건: 중고
마지막 검증일60일 이상 전

ASML / HMI

eScan 1100

verified-listing-icon
검증됨
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
listing-photo-dd509fe71dbe4dd4b72a0400552403d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3780/dd509fe71dbe4dd4b72a0400552403d7/1ce59e4bf27b45db83603f2de96dddee_b1261f4c62394ee9bb699f75b66e31491201a_mw.jpeg
listing-photo-dd509fe71dbe4dd4b72a0400552403d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3780/dd509fe71dbe4dd4b72a0400552403d7/79b110a1894c456d97132fc891ea009a_55dcc279025a49ae9c0f666ed810d7ad_mw.jpeg
listing-photo-dd509fe71dbe4dd4b72a0400552403d7-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3780/dd509fe71dbe4dd4b72a0400552403d7/a315b1cec14d4295a324310a8ac302f7_76a61bf5e4db47a1a39c7e1f52eac86a_mw.jpeg
주요 품목 세부 정보
조건:

Used

작동 상태:

알 수 없음

제품 ID:

72756

웨이퍼 사이즈:

알 수 없음

빈티지:

알 수 없음

Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음
환경 설정
환경 설정 없음
OEM 모델 설명
The first multiple e-beam (multibeam) wafer inspection system for in-line defect inspection applications. Following in the footsteps of the eScan 1000, the eScan 1100 offers new levels of efficiency in high throughput wafer inspection.
문서

문서 없음

유사 등재물
모두 보기
ASML / HMI eScan 1100

ASML / HMI

eScan 1100

Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전