설명
Taken Offline in July환경 설정
6"OEM 모델 설명
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.문서
문서 없음
KLA
AIT II
검증됨
카테고리
Defect Inspection
마지막 검증일: 28일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
100099
웨이퍼 사이즈:
6"/150mm
빈티지:
2000
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기KLA
AIT II
카테고리
Defect Inspection
마지막 검증일: 28일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
100099
웨이퍼 사이즈:
6"/150mm
빈티지:
2000
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Taken Offline in July환경 설정
6"OEM 모델 설명
The AIT II is a patterned wafer inspection system for 150 to 300 mm wafers that provides fast, accurate feedback on process tool performance. It offers an integrated solution for automated defect classification and analysis, quickly turning defect data into yield-enhancing information. It is designed for flexibility in films, etch, photo, and CMP applications and offers advantages such as reducing process excursions, increasing overall equipment effectiveness, improving yield stability/predictability, and augmenting line monitoring.문서
문서 없음