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설명
Defect Review (SEM)환경 설정
2 LP+1 ChamberOEM 모델 설명
The eDR-5200 features a lens system that delivers a significant improvement in resolution, meeting production and process development requirements for advanced design-rule semiconductor devices. Unique connectivity technology between the eDR-5200 and our market-leading inspection systems provides additional benefits to our customers with respect to defect redetection, classification and speed.문서
문서 없음
KLA
eDR-5200
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
62883
웨이퍼 사이즈:
12"/300mm
빈티지:
2010
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설명
Defect Review (SEM)환경 설정
2 LP+1 ChamberOEM 모델 설명
The eDR-5200 features a lens system that delivers a significant improvement in resolution, meeting production and process development requirements for advanced design-rule semiconductor devices. Unique connectivity technology between the eDR-5200 and our market-leading inspection systems provides additional benefits to our customers with respect to defect redetection, classification and speed.문서
문서 없음