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KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM 모델 설명
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.문서
문서 없음
KLA
eS32
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Parts Tool
작동 상태:
알 수 없음
제품 ID:
44484
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
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설명
설명 없음환경 설정
KLA ES32 (1) - Stage, electron source, feed throughs included KLA ES32 (2) - Stage, electron source, pre-aligner, feed throughs, stage lasers included Scan amp boards are missing on both toolsOEM 모델 설명
In February 2006, KLA introduced the latest addition to our eS3x series of e-beam inspection systems—the eS32. A single system spanning development and production applications, the eS32 provides the best sensitivity at throughput for defect types that optical systems cannot find.문서
문서 없음