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설명
E-beam Inspection환경 설정
환경 설정 없음OEM 모델 설명
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.문서
문서 없음
KLA
eS805
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
50097
웨이퍼 사이즈:
12"/300mm
빈티지:
알 수 없음
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설명
E-beam Inspection환경 설정
환경 설정 없음OEM 모델 설명
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.문서
문서 없음