설명
설명 없음환경 설정
KLA-Tencor 7700 Surfscan Wafer Inspection - Minor parts missing (ex. end effector) - V: 208, A: 20 - Phase 2, Hz: 60OEM 모델 설명
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.문서
문서 없음
KLA
SURFSCAN 7700
검증됨
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
83853
웨이퍼 사이즈:
알 수 없음
빈티지:
1995
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기KLA
SURFSCAN 7700
카테고리
Defect Inspection
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
83853
웨이퍼 사이즈:
알 수 없음
빈티지:
1995
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
KLA-Tencor 7700 Surfscan Wafer Inspection - Minor parts missing (ex. end effector) - V: 208, A: 20 - Phase 2, Hz: 60OEM 모델 설명
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.문서
문서 없음