설명
Particle detector환경 설정
Pattern WaferOEM 모델 설명
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 28일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
136961
웨이퍼 사이즈:
6"/150mm, 8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
SURFSCAN 7700
카테고리
Defect Inspection
마지막 검증일: 28일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
136961
웨이퍼 사이즈:
6"/150mm, 8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Particle detector환경 설정
Pattern WaferOEM 모델 설명
Surfscan 7700 is an in-line equipment that monitors contamination on all types of devices with an optimal sensitivity of 0.15 micron. It can detect contaminants below 0.20 micron on complex process levels and multiple systems can be correlated using the same inspection recipes. It also has a microscope review option for on-line classification of contaminants.문서
문서 없음