설명
Wafer defect detection환경 설정
환경 설정 없음OEM 모델 설명
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.문서
문서 없음
KLA
2132
검증됨
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
110364
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
2132
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
110364
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Wafer defect detection환경 설정
환경 설정 없음OEM 모델 설명
The KLA 2132 is an all pattern inspection model introduced by KLA, a company that produces inspection equipment for microprocessors, logic devices, and memory devices. It is part of the 2100 series and was introduced after the 2131 and before the 2135. Compared to its predecessor, the 2132 has greater sensitivity and maximum speed. The 2135, which was introduced in 1996, has twice the throughput and higher sensitivity compared to the 2132.문서
문서 없음