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환경 설정 없음OEM 모델 설명
The AIT XP is a high-throughput scanning product for patterned wafer inspection that adjusts dynamically to all die regions, delivering maximum sensitivity and improved detection of killer defects. It features faster recipe setup, improved recipe robustness, and user-friendly setup templates. It enables improved cost of ownership and extends a fab’s inspection capability. The 23xx series, the AIT series, and the eS30 form part of a KLA-Tencor strategy that combines inspection technologies to offer fabs a new, customized strategy for capturing and controlling defects. KLA-Tencor delivers an overall defect-control solution through a comprehensive range of defect reduction and control technology.문서
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KLA
AIT XP
카테고리
Defect Inspection
마지막 검증일: 13일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
19241
웨이퍼 사이즈:
8"/200mm
빈티지:
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The AIT XP is a high-throughput scanning product for patterned wafer inspection that adjusts dynamically to all die regions, delivering maximum sensitivity and improved detection of killer defects. It features faster recipe setup, improved recipe robustness, and user-friendly setup templates. It enables improved cost of ownership and extends a fab’s inspection capability. The 23xx series, the AIT series, and the eS30 form part of a KLA-Tencor strategy that combines inspection technologies to offer fabs a new, customized strategy for capturing and controlling defects. KLA-Tencor delivers an overall defect-control solution through a comprehensive range of defect reduction and control technology.문서
문서 없음