설명
Laser Service History: The system is equipped with a new laser under warranty. Usage Environment: Previously used in an HDD (hard disk drive) manufacturing environment. Current Status: The system is currently sealed and stored in our lab. The tool is currently running on Windows XP Cleaning System Compatibility: There is no dedicated cleaning system included for aluminum or glass substrates.환경 설정
환경 설정 없음OEM 모델 설명
The Candela™ 7100 is a hard disk inspection system that detects and classifies submicron defects such as micro-pits, bumps, particles, and buried defects. It helps manufacturers maximize yield and lower the total cost of hard disk inspection. It also reduces the dependency on manual, non-production tools and methods for defect investigation and root cause identification.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled / Uncrated
제품 ID:
128183
웨이퍼 사이즈:
알 수 없음
빈티지:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA 7100
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled / Uncrated
제품 ID:
128183
웨이퍼 사이즈:
알 수 없음
빈티지:
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Laser Service History: The system is equipped with a new laser under warranty. Usage Environment: Previously used in an HDD (hard disk drive) manufacturing environment. Current Status: The system is currently sealed and stored in our lab. The tool is currently running on Windows XP Cleaning System Compatibility: There is no dedicated cleaning system included for aluminum or glass substrates.환경 설정
환경 설정 없음OEM 모델 설명
The Candela™ 7100 is a hard disk inspection system that detects and classifies submicron defects such as micro-pits, bumps, particles, and buried defects. It helps manufacturers maximize yield and lower the total cost of hard disk inspection. It also reduces the dependency on manual, non-production tools and methods for defect investigation and root cause identification.문서
문서 없음