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KLA CANDELA CS900

설명

Surface Analyzer

환경 설정

- Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes

OEM 모델 설명

KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.

문서

파일 아이콘

Candela CS 900.mov

KLA

CANDELA CS900

verified-listing-icon

검증됨

카테고리

Defect Inspection

마지막 검증일: 30일 이상 전

주요 품목 세부 정보

조건:

Used

작동 상태:

알 수 없음

제품 ID:

90138

웨이퍼 사이즈:

4"/100mm, 5"/125mm, 6"/150mm

빈티지:

2017

Have Additional Questions?

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

유사 등재물

KLA CANDELA CS900

KLA

CANDELA CS900

Defect Inspection

빈티지: 2017조건: 중고

마지막 검증일30일 이상 전

KLA

CANDELA CS900

verified-listing-icon

검증됨

카테고리

Defect Inspection

마지막 검증일: 30일 이상 전

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주요 품목 세부 정보

조건:

Used

작동 상태:

알 수 없음

제품 ID:

90138

웨이퍼 사이즈:

4"/100mm, 5"/125mm, 6"/150mm

빈티지:

2017

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

설명

Surface Analyzer

환경 설정

- Software version: 10.2.4.0101 - This is a CS900 running CS920 software -Tool powers on and initializes

OEM 모델 설명

KLA / TENCOR Candela CS900 surface defect and EPI epitaxial defect inspection equipment is used for inspection and analysis of defects in Si silicon wafers and GaN epitaxial wafers, SiC substrates and SiC epitaxial wafers. Other applications for the Candela CS900 include EPI epitaxial defects, including particles, scratches, pits, pollution, traces, and PL function can also be added for detection some GaN EPI defects and SiC EPI defects. The device is compatible with transparent and opaque films.

문서

파일 아이콘

Candela CS 900.mov

유사 등재물

KLA CANDELA CS900

KLA

CANDELA CS900

Defect Inspection빈티지: 2017조건: 중고마지막 검증일: 30일 이상 전