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KLA SP1-TBI
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    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SP1 is an unpatterned surface inspection system that can be configured with KLA-Tencor’s Triple-Beam Illumination™ (TBI) technology for exceptional sensitivity on rough films. This technology adds an oblique illumination beam to the SP1’s standard optical configuration, enhancing its ability to capture and distinguish all variations of pits, including crystal originated pits (COPs), from particles. The TBI option maintains the SP1’s axi-symmetric design and allows the use of Adaptive Collection Optics for superior capture of defects on different substrate surfaces.
    문서

    문서 없음

    KLA

    SP1-TBI

    verified-listing-icon

    검증됨

    카테고리
    Defect Inspection

    마지막 검증일: 30일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    112642


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspection
    빈티지: 2001조건: 중고
    마지막 검증일20일 전

    KLA

    SP1-TBI

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 30일 이상 전
    listing-photo-8f35f444f1cd4437a98f9e1ee368d85c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    알 수 없음


    제품 ID:

    112642


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    알 수 없음


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    설명 없음
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The SP1 is an unpatterned surface inspection system that can be configured with KLA-Tencor’s Triple-Beam Illumination™ (TBI) technology for exceptional sensitivity on rough films. This technology adds an oblique illumination beam to the SP1’s standard optical configuration, enhancing its ability to capture and distinguish all variations of pits, including crystal originated pits (COPs), from particles. The TBI option maintains the SP1’s axi-symmetric design and allows the use of Adaptive Collection Optics for superior capture of defects on different substrate surfaces.
    문서

    문서 없음

    유사 등재물
    모두 보기
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspection빈티지: 2001조건: 중고마지막 검증일:20일 전
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspection빈티지: 0조건: 부품 도구마지막 검증일:30일 이상 전
    KLA SP1-TBI

    KLA

    SP1-TBI

    Defect Inspection빈티지: 0조건: 중고마지막 검증일:60일 이상 전