설명
Wafer Inspection System Details Attached환경 설정
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEM 모델 설명
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 22일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
148640
웨이퍼 사이즈:
4"/100mm, 6"/150mm, 8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
SURFSCAN 6100
카테고리
Defect Inspection
마지막 검증일: 22일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
Deinstalled
제품 ID:
148640
웨이퍼 사이즈:
4"/100mm, 6"/150mm, 8"/200mm
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Wafer Inspection System Details Attached환경 설정
· Tencor 6100 Detection: 0.16 micron on Bare Silicon. · Red Laser 632 nm, matches 4500 data · Advanced Data output/GEM SECS · System Circuit Boards! · Tencor 6100OEM 모델 설명
The Surfscan 6100 is a tool that is capable of detecting defects on a surface. It can locate, measure the size of, and count the number of defects that are as small as 0.157 micrometers in size. Additionally, it has a high capture rate of 95%, meaning it can accurately detect the vast majority of defects present on a surface.문서
문서 없음