설명
Missing: Blower환경 설정
Additional info details below in photos.... Windows System: Windows XP SP2 Main S/W: NGS 5.30 Wafer Size: 300mm SEMI NotchOEM 모델 설명
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 15일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
140509
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KLA
SURFSCAN SP2
카테고리
Defect Inspection
마지막 검증일: 15일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
140509
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Missing: Blower환경 설정
Additional info details below in photos.... Windows System: Windows XP SP2 Main S/W: NGS 5.30 Wafer Size: 300mm SEMI NotchOEM 모델 설명
The Surfscan SP2 is an unpatterned wafer surface inspection tool that uses UV laser technology, darkfield optics, and advanced algorithms to detect defects as small as 30nm. It provides high sensitivity detection on engineered substrates and has a significant throughput increase over the prior-generation tool. It offers a single tool solution for three technology nodes and has comprehensive wafer surface inspection capabilities. It also enables faster root-cause analysis with improved coordinate accuracy and real-time defect classification capability.문서
문서 없음