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설명
KLA Advanced Macro Inspection Module환경 설정
Macro InspectionOEM 모델 설명
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.문서
문서 없음
KLA
2900
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
91270
웨이퍼 사이즈:
12"/300mm
빈티지:
2011
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설명
KLA Advanced Macro Inspection Module환경 설정
Macro InspectionOEM 모델 설명
2900 and 2905: Optical broadband plasma wafer defect inspectors that provide capture of yield-relevant defects on 2Xnm memory and logic devices.문서
문서 없음