설명
Wafer inspection system환경 설정
Power requirements: 208 V 50/60 Hz CE markedOEM 모델 설명
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.문서
문서 없음
KLA
8900
카테고리
Defect Inspection
마지막 검증일: 10일 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
153416
웨이퍼 사이즈:
8"/200mm, 12"/300mm
빈티지:
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Wafer inspection system환경 설정
Power requirements: 208 V 50/60 Hz CE markedOEM 모델 설명
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.문서
문서 없음