설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The Candela 8520 is a surface inspection system that uses proprietary optical technology to measure scatter intensity at two angles of incidence. It detects and classifies a broad range of defects on Wide Band Gap materials including SiC and GaN, up to 200mm in diameter. It is used for substrate quality control, vendor comparison, process control, and tool monitoring in the SiC and GaN power device industries. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.문서
문서 없음
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
132009
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA 8520
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
132009
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The Candela 8520 is a surface inspection system that uses proprietary optical technology to measure scatter intensity at two angles of incidence. It detects and classifies a broad range of defects on Wide Band Gap materials including SiC and GaN, up to 200mm in diameter. It is used for substrate quality control, vendor comparison, process control, and tool monitoring in the SiC and GaN power device industries. Options include SECS-GEM, light tower, diamond scribe, calibration standards, offline software, OCR, and photoluminescence.문서
문서 없음