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KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
  • KLA CANDELA CS1
설명
No missing parts.
환경 설정
환경 설정 없음
OEM 모델 설명
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
문서

문서 없음

카테고리
Defect Inspection

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

47112


웨이퍼 사이즈:

알 수 없음


빈티지:

2007


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

CANDELA CS1

verified-listing-icon
검증됨
카테고리
Defect Inspection
마지막 검증일: 60일 이상 전
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listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/80bb7dff47244bef82d6c5a5646115e7_0e1585aaf4f64ddd889092b9360c7f801105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/39d779b945fd40abaa16769e8f969bbd_a655698ffaea4c3aa88b203512e2f1861105c_mw.jpeg
listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/cf2e72f51bfe43b79cb148822390c49f_4f6ddaba8d114c9c91acbf1432c8d1bf1105c_mw.jpeg
주요 품목 세부 정보

조건:

Used


작동 상태:

알 수 없음


제품 ID:

47112


웨이퍼 사이즈:

알 수 없음


빈티지:

2007


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
No missing parts.
환경 설정
환경 설정 없음
OEM 모델 설명
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
문서

문서 없음