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KLA eDR-7280
    설명
    There are two loading ports. One is for 300mm FOUP & FOSB and another is for 200mm FOUP and Open cassette
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The eDR7280 is an electronbeam wafer defect review and classification system that utilizes improved imaging and automatic defect classification capability to identify detected defects and produce an accurate representation of the detected defect population.
    문서

    KLA

    eDR-7280

    verified-listing-icon

    검증됨

    카테고리
    Defect Inspection

    마지막 검증일: 60일 이상 전

    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Installed / Running


    제품 ID:

    111650


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2016


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    유사 등재물
    모두 보기
    KLA eDR-7280

    KLA

    eDR-7280

    Defect Inspection
    빈티지: 2016조건: 중고
    마지막 검증일60일 이상 전

    KLA

    eDR-7280

    verified-listing-icon
    검증됨
    카테고리
    Defect Inspection
    마지막 검증일: 60일 이상 전
    listing-photo-b4fd4529f5fe4b6596355c3d3fd30452-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/3144/b4fd4529f5fe4b6596355c3d3fd30452/4f0a45c0350947eb861d2c38acbc3f72_1e45b917ee6a47a29087b0b983d60902_mw.jpeg
    주요 품목 세부 정보

    조건:

    Used


    작동 상태:

    Installed / Running


    제품 ID:

    111650


    웨이퍼 사이즈:

    알 수 없음


    빈티지:

    2016


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    설명
    There are two loading ports. One is for 300mm FOUP & FOSB and another is for 200mm FOUP and Open cassette
    환경 설정
    환경 설정 없음
    OEM 모델 설명
    The eDR7280 is an electronbeam wafer defect review and classification system that utilizes improved imaging and automatic defect classification capability to identify detected defects and produce an accurate representation of the detected defect population.
    문서
    유사 등재물
    모두 보기
    KLA eDR-7280

    KLA

    eDR-7280

    Defect Inspection빈티지: 2016조건: 중고마지막 검증일:60일 이상 전