설명
Chroma Prober 58173-FC환경 설정
환경 설정 없음OEM 모델 설명
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.문서
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CHROMA
58173
카테고리
Electronic Test
마지막 검증일: 30일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
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제품 ID:
135856
웨이퍼 사이즈:
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빈티지:
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Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
Chroma Prober 58173-FC환경 설정
환경 설정 없음OEM 모델 설명
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.문서
문서 없음