설명
The 2614B SourceMeter SMU Instrument is a new dual-channel SMU instrument with best-in-class value and performance. Its tightly integrated, four-quadrant design allows it to simultaneously source and measure both voltage and current to boost productivity in R&D and bench-top applications. The Model 2614B is equipped with Keithley's high speed TSP technology, which is over 190% faster than traditional PC-to-instrument communication techniques. The Model 2614B is designed for bench-top applications and, therefore, does not have the high-end, system-level automation features of the Model 2612B SourceMeter SMU Instrument, which includes digital I/O, TSP-Link technology, and contact check function.환경 설정
환경 설정 없음OEM 모델 설명
Electronic Test문서
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KEITHLEY
2614B
검증됨
카테고리
Electronic Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
84358
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
유사 등재물
모두 보기
KEITHLEY
2614B
카테고리
Electronic Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
84358
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
The 2614B SourceMeter SMU Instrument is a new dual-channel SMU instrument with best-in-class value and performance. Its tightly integrated, four-quadrant design allows it to simultaneously source and measure both voltage and current to boost productivity in R&D and bench-top applications. The Model 2614B is equipped with Keithley's high speed TSP technology, which is over 190% faster than traditional PC-to-instrument communication techniques. The Model 2614B is designed for bench-top applications and, therefore, does not have the high-end, system-level automation features of the Model 2612B SourceMeter SMU Instrument, which includes digital I/O, TSP-Link technology, and contact check function.환경 설정
환경 설정 없음OEM 모델 설명
Electronic Test문서
문서 없음