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환경 설정 없음OEM 모델 설명
The 81637B Fast Power Meter is a high-performance instrument designed for rapid data acquisition, achieving speeds of 25 µS and offering a robust dynamic range of over 55dB without the need to change range settings. It provides extensive data storage capacity, up to 100,000 data points, and maintains low spectral ripple. As the premium model, the 81637B stands out for its minimal Polarization Dependent Loss (PDL) dependency, setting it apart from its economical counterpart, the 81636B. This makes the 81637B particularly effective for applications such as swept lambda testing and the assessment of PDL-sensitive devices, where quick and precise WDM component characterization over wavelength is essential.문서
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
81637B
검증됨
카테고리
Electronic Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
88264
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KEYSIGHT / AGILENT / HEWLETT-PACKARD (HP)
81637B
카테고리
Electronic Test
마지막 검증일: 60일 이상 전
주요 품목 세부 정보
조건:
Used
작동 상태:
알 수 없음
제품 ID:
88264
웨이퍼 사이즈:
알 수 없음
빈티지:
알 수 없음
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
설명
설명 없음환경 설정
환경 설정 없음OEM 모델 설명
The 81637B Fast Power Meter is a high-performance instrument designed for rapid data acquisition, achieving speeds of 25 µS and offering a robust dynamic range of over 55dB without the need to change range settings. It provides extensive data storage capacity, up to 100,000 data points, and maintains low spectral ripple. As the premium model, the 81637B stands out for its minimal Polarization Dependent Loss (PDL) dependency, setting it apart from its economical counterpart, the 81636B. This makes the 81637B particularly effective for applications such as swept lambda testing and the assessment of PDL-sensitive devices, where quick and precise WDM component characterization over wavelength is essential.문서
문서 없음