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SEMILAB SE-3000

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환경 설정

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OEM 모델 설명

Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity

문서

파일 아이콘

SOPRA frame SE300.pdf

SEMILAB

SE-3000

verified-listing-icon

검증됨

카테고리

Elipsometry

마지막 검증일: 60일 이상 전

주요 품목 세부 정보

조건:

Used

작동 상태:

알 수 없음

제품 ID:

84893

웨이퍼 사이즈:

12"/300mm

빈티지:

2004

Have Additional Questions?

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

유사 등재물

SEMILAB SE-3000

SEMILAB

SE-3000

빈티지: 2004조건: 중고

마지막 검증일60일 이상 전

SEMILAB

SE-3000

verified-listing-icon

검증됨

카테고리

Elipsometry

마지막 검증일: 60일 이상 전

listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/a2cda83d16404a269edfdfe64a73056e_7a1abc1cab804d11b2363a26987355bd_mw.jpeg

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listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/3e4d17a45f184b65b1c00c5189af7403_92064762282546549b002a741bee612d_mw.jpeg

listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/b9267f7969884871a78fe9bc8f1a99f5_abb494cf22a74e4db4b590742119356a_mw.jpeg

listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/58a6ace9ff324b8182853a9446532a37_f3cbe3b50068410daac7b3b18744d420_mw.jpeg

listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/6dcc90a1e77445748a163eeaac47b9d2_77d13ad3a6f94ee786aacf4c433e32d645005c_mw.jpeg

listing-photo-6b25faf0d6cf43f8abd5bb75979731a4-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/73875/6b25faf0d6cf43f8abd5bb75979731a4/865858dbd27a4d008e30feffac08e0f7_3c5ff27725794b228339e8975a2d824c1201a_mw.jpeg

주요 품목 세부 정보

조건:

Used

작동 상태:

알 수 없음

제품 ID:

84893

웨이퍼 사이즈:

12"/300mm

빈티지:

2004

Logistics Support

Available

Money Back Guarantee

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

설명

설명 없음

환경 설정

환경 설정 없음

OEM 모델 설명

Microspot Spectroscopic Ellipsometer Microspot spectroscopic ellipsometer of Semilab are capable of fully automated characterization of patterned, compound or (O)LED 300mm samples. Primary applications: - Front-end applications - Production wafer monitoring - Process development - Advanced Process Control: - Across wafer uniformity - Wafer to wafer uniformity - Batch to batch uniformity

문서

파일 아이콘

SOPRA frame SE300.pdf

유사 등재물

SEMILAB SE-3000

SEMILAB

SE-3000

Elipsometry빈티지: 2004조건: 중고마지막 검증일: 60일 이상 전